TA Instruments Discovery Xenon Flash Diffusivity System DXF-900 853002.901

The TA Instruments Discovery Xenon Flash Diffusivity System DXF-900 853002.901 is a high-speed Xenon source system designed for accurate thermal diffusivity measurements up to 900°C. It features a patented High-Speed Xenon-Pulse Delivery™ source and multi-faceted Light Pipe™ for uniform intensity across specimens, preventing over-flash. The system is capable of testing samples up to 25.4 mm in diameter and offers superior accuracy in thermal conductivity measurements. It is designed for research, development, and production control applications.

Key Features:

• Patented Pulse-Delivery system for energy accuracy
• Real-time mapping for thin and highly conductive materials
• Wide variety of trays for flexibility in sample sizes and shapes
• Autosampler with four-position alumina tray for productivity
• Advanced resistance-heated furnace for stability and uniformity

Advantages:

• Provides 50% more energy than competitive designs for high accuracy
• Effective collection and collimation of light for homogeneous radiation
• Designed to meet industry standard test methods for reliability
• High sensitivity IR detector for optimum signal-to-noise ratio
• Ensures accurate measurements across a wide temperature range from ambient to 900°C